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@ARTICLE{Narimani:859060,
author = {Narimani, Keyvan and Trellenkamp, Stefan and Tiedemann,
Andreas and Mantl, Siegfried and Zhao, Qing-Tai},
title = {{S}trained {S}ilicon {S}ingle {N}anowire
{G}ate-{A}ll-{A}round {TFET}s with {O}ptimized {T}unneling
{J}unctions},
journal = {Applied Sciences},
volume = {8},
number = {5},
issn = {2076-3417},
address = {Basel},
publisher = {MDPI},
reportid = {FZJ-2019-00011},
pages = {670 -},
year = {2018},
abstract = {In this work, we demonstrate a strained Si single nanowire
tunnel field effect transistor (TFET) with gate-all-around
(GAA) structure yielding Ion-current of 15 μA/μm at the
supply voltage of Vdd = 0.5V with linear onset at low drain
voltages. The subthreshold swing (SS) at room temperature
shows an average of 76 mV/dec over 4 orders of drain current
Id from 5 × 10−6 to 5 × 10−2 µA/µm. Optimized
devices also show excellent current saturation, an important
feature for analog performance},
cin = {PGI-9},
ddc = {600},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000437326800017},
doi = {10.3390/app8050670},
url = {https://juser.fz-juelich.de/record/859060},
}