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@INPROCEEDINGS{Glass:859068,
author = {Glass, S. and Schulte-Braucks, C. and Kibkalo, L. and
Breuer, U. and Hartmann, J. M. and Buca, D. and Mantl, S.
and Zhao, Q. T.},
title = {{E}xamination of a new {S}i{G}e/{S}i heterostructure {TFET}
concept based on vertical tunneling},
publisher = {IEEE},
reportid = {FZJ-2019-00019},
pages = {1-3},
year = {2017},
comment = {2017 Fifth Berkeley Symposium on Energy Efficient
Electronic Systems $\&$ Steep Transistors Workshop (E3S)},
booktitle = {2017 Fifth Berkeley Symposium on
Energy Efficient Electronic Systems
$\&$ Steep Transistors Workshop (E3S)},
abstract = {This paper presents a Tunneling Field Effect Transistor
concept with a vertical SiGe/Si hetero tunneling junction
utilizing a design which promotes line tunneling in a
source-gate overlap region. By contrast, the influence of
parasitic point tunneling is marginal in the structure,
resulting in a sharp turn-on. We show that the growth of a
suitable layer stack and manufacturing a device is perfectly
feasible and provide first electrical measurements serving
as a proof of concept. The route to enhancing the
performance by scaling device dimensions and adjusting the
channel doping is examined by means of TCAD simulations.},
month = {Oct},
date = {2017-10-19},
organization = {2017 Fifth Berkeley Symposium on
Energy Efficient Electronic Systems
$\&$ Steep Transistors Workshop (E3S),
Berkeley (USA), 19 Oct 2017 - 20 Oct
2017},
cin = {PGI-9 / ZEA-3},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)ZEA-3-20090406},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1109/E3S.2017.8246169},
url = {https://juser.fz-juelich.de/record/859068},
}