Review/Book FZJ-2019-00553

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Standing-Wave and Resonant Soft- and Hard-X-ray Photoelectron Spectroscopy of Oxide Interfaces

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2018
Springer International Publishing Cham
ISBN: 978-3-319-74988-4 (print), 978-3-319-74989-1 (electronic)

Spectroscopy of Complex Oxide Interfaces / Cancellieri, Claudia (Editor) ; Cham : Springer International Publishing, 2018, Chapter 7 ; ISSN: 0933-033X=2196-2812 ; ISBN: 978-3-319-74988-4=978-3-319-74989-1 ; doi:10.1007/978-3-319-74989-1 Cham : Springer International Publishing, Springer Series in Materials Science 266, 153 - 179 () [10.1007/978-3-319-74989-1_7]

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Abstract: We discuss several new directions in photoemission that permit more quantitatively studying buried interfaces: going to higher energies in the multi-keV regime; using standing-wave excitation, created by reflection from either a multilayer heterostructure or atomic planes; tuning the photon energy to specific points near absorption resonances; and making use of near-total-reflection geometries. Applications to a variety of oxide and spintronic systems are discussed.


Contributing Institute(s):
  1. Elektronische Eigenschaften (PGI-6)
Research Program(s):
  1. 522 - Controlling Spin-Based Phenomena (POF3-522) (POF3-522)

Appears in the scientific report 2018
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Dokumenttypen > Bücher > Rezension
Dokumenttypen > Bücher > Bücher
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