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Poster (Other) FZJ-2019-00886
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The influence of interfacial (sub)oxide layers on the properties of pristine resistive switching devices

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2018

2018 Non-Volatile Memory Technology Symposium, NVTMS, SendaiSendai, Japan, 22 Oct 2018 - 24 Oct 20182018-10-222018-10-24

Contributing Institute(s):
  1. JARA-FIT (JARA-FIT)
  2. Elektronische Materialien (PGI-7)
Research Program(s):
  1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2018
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JARA > JARA > JARA-JARA\-FIT
Document types > Presentations > Poster
Institute Collections > PGI > PGI-7
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 Record created 2019-01-29, last modified 2021-01-30
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