Home > Publications database > Interface thickness optimization of lead-free oxide multilayer capacitors for high-performance energy storage |
Journal Article | FZJ-2019-01063 |
; ; ; ; ; ; ; ; ;
2018
RSC72819
London [u.a.]
This record in other databases:
Please use a persistent id in citations: doi:10.1039/C7TA10271B
Abstract: The effects of interface density and total multilayer film thickness on the dielectric properties and breakdown behavior have been revealed in this work by investigating the environment-friendly energy storage multilayer films of Ba0.7Ca0.3TiO3 (BCT) and BaZr0.2Ti0.8O3 (BZT) dielectrics. Numerical simulations based on a finite element method have given the breakdown process vividly, which agreed well with the experimental results. Moreover, not only the ultrahigh energy storage density of 51.8 J cm−3 with a great efficiency of 81.2% at room temperature but also robust thermal stability has been obtained by optimizing the interface density and total thickness. High energy density above 25.1 J cm−3 and excellent efficiency over 63.6% from room temperature to 200 °C provide a solid basis for potential applications of the multilayer systems in harsh environments.
![]() |
The record appears in these collections: |