Home > Publications database > Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays |
Journal Article | FZJ-2019-02790 |
; ; ;
2019
Elsevier Science
Amsterdam
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Please use a persistent id in citations: doi:10.1016/j.ultramic.2019.02.008
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