%0 Journal Article
%A Mei, Antonio B.
%A Tang, Yongjian
%A Schubert, Jürgen
%A Jena, Debdeep
%A Xing, Huili
%A Ralph, Daniel C.
%A Schlom, Darrell G.
%T Self-assembly and properties of domain walls in BiFeO3 layers grown via molecular-beam epitaxy
%J APL materials
%V 7
%N 7
%@ 2166-532X
%C Melville, NY
%I AIP Publ.
%M FZJ-2019-04360
%P 071101 -
%D 2019
%X Bismuth ferrite layers, ∼200-nm-thick, are deposited on SrRuO 3 -coated DyScO 3 (110) o substrates in a step-flow growth regime via adsorption-controlled molecular-beam epitaxy. Structural characterization shows the films to be phase pure with substrate-limited mosaicity (0.012 ○x-ray diffraction ω-rocking curve widths). The film surfaces are atomically smooth (0.2 nm root-mean-square height fluctuations) and consistof 260-nm-wide [11̄1] o -oriented terraces and unit-cell-tall (0.4 nm) step edges. The combination of electrostatic and symmetry boundaryconditions promotes two monoclinically distorted BiFeO 3 ferroelectric variants, which self-assemble into a pattern with unprecedentedlycoherent periodicity, consisting of 145 ± 2-nm-wide stripe domains separated by [001] o -oriented 71 ○ domain walls. The walls exhibit electricalrectification and enhanced conductivity.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000478911400011
%R 10.1063/1.5103244
%U https://juser.fz-juelich.de/record/864662