TY  - JOUR
AU  - Mei, Antonio B.
AU  - Tang, Yongjian
AU  - Schubert, Jürgen
AU  - Jena, Debdeep
AU  - Xing, Huili
AU  - Ralph, Daniel C.
AU  - Schlom, Darrell G.
TI  - Self-assembly and properties of domain walls in BiFeO3 layers grown via molecular-beam epitaxy
JO  - APL materials
VL  - 7
IS  - 7
SN  - 2166-532X
CY  - Melville, NY
PB  - AIP Publ.
M1  - FZJ-2019-04360
SP  - 071101 -
PY  - 2019
AB  - Bismuth ferrite layers, ∼200-nm-thick, are deposited on SrRuO 3 -coated DyScO 3 (110) o substrates in a step-flow growth regime via adsorption-controlled molecular-beam epitaxy. Structural characterization shows the films to be phase pure with substrate-limited mosaicity (0.012 ○x-ray diffraction ω-rocking curve widths). The film surfaces are atomically smooth (0.2 nm root-mean-square height fluctuations) and consistof 260-nm-wide [11̄1] o -oriented terraces and unit-cell-tall (0.4 nm) step edges. The combination of electrostatic and symmetry boundaryconditions promotes two monoclinically distorted BiFeO 3 ferroelectric variants, which self-assemble into a pattern with unprecedentedlycoherent periodicity, consisting of 145 ± 2-nm-wide stripe domains separated by [001] o -oriented 71 ○ domain walls. The walls exhibit electricalrectification and enhanced conductivity.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000478911400011
DO  - DOI:10.1063/1.5103244
UR  - https://juser.fz-juelich.de/record/864662
ER  -