Journal Article

FZJ-2019-05633

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png A scanning reflection X-ray microscope for magnetic imaging in the EUV range

Schümmer, A. (Corresponding author) ; Mertins, H.-C. ; Schneider, C. M.FZJ* ; Adam, R.FZJ* ; Trellenkamp, S.FZJ* ; Borowski, R.FZJ* ; Bürgler, D. E.FZJ* ; Juschkin, L. ; Berges, U.

2019
Wiley-Blackwell [S.l.]

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Please use a persistent id in citations: doi:10.1107/S1600577519012219

Abstract: The mechanical setup of a novel scanning reflection X-ray microscope is presented. It is based on zone plate optics optimized for reflection mode in the EUV spectral range. The microscope can operate at synchrotron radiation beamlines as well as at laboratory-based plasma light sources. In contrast to established X-ray transmission microscopes that use thin foil samples, the new microscope design presented here allows the investigation of any type of bulk materials. Importantly, this permits the investigation of magnetic materials by employing experimental techniques based on X-ray magnetic circular dichroism, X-ray linear magnetic dichroism or the transversal magneto-optical Kerr effect (T-MOKE). The reliable functionality of the new microscope design has been demonstrated by T-MOKE microscopy spectra of Fe/Cr-wedge/Fe trilayer samples. The spectra were recorded at various photon energies across the Fe 3p edge revealing the orientation of magnetic domains in the sample.

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. 522 - Controlling Spin-Based Phenomena (POF3-522) (POF3-522)

Appears in the scientific report 2019

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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