%0 Journal Article
%A Vezhlev, E.
%A Ioffe, A.
%A Mattauch, S.
%A Staringer, S.
%A Ossovyi, V.
%A Felder, Ch.
%A Hüger, E.
%A Vacik, J.
%A Tomandl, I.
%A Hnatowicz, V.
%A Chen, Chunguang
%A Notten, P. H. L.
%A Brückel, Th.
%T A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
%J Radiation effects and defects in solids
%V 175
%N 3-4
%@ 0033-7579
%C London [u.a.]
%I Taylor & Francis
%M FZJ-2020-00539
%P 342 - 355
%D 2020
%X A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and LiNbO3 amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000522130000012
%R 10.1080/10420150.2019.1701466
%U https://juser.fz-juelich.de/record/873091