TY  - JOUR
AU  - Vezhlev, E.
AU  - Ioffe, A.
AU  - Mattauch, S.
AU  - Staringer, S.
AU  - Ossovyi, V.
AU  - Felder, Ch.
AU  - Hüger, E.
AU  - Vacik, J.
AU  - Tomandl, I.
AU  - Hnatowicz, V.
AU  - Chen, Chunguang
AU  - Notten, P. H. L.
AU  - Brückel, Th.
TI  - A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
JO  - Radiation effects and defects in solids
VL  - 175
IS  - 3-4
SN  - 0033-7579
CY  - London [u.a.]
PB  - Taylor & Francis
M1  - FZJ-2020-00539
SP  - 342 - 355
PY  - 2020
AB  - A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and LiNbO3 amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000522130000012
DO  - DOI:10.1080/10420150.2019.1701466
UR  - https://juser.fz-juelich.de/record/873091
ER  -