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@ARTICLE{Kreysing:873330,
      author       = {Kreysing, Eva and Seyock, Silke and Hassani, Hossein and
                      Brauweiler-Reuters, Elke and Neumann, Elmar and
                      Offenhäusser, Andreas},
      title        = {{C}orrelating {S}urface {P}lasmon {R}esonance {M}icroscopy
                      of {L}iving and {F}ixated {C}ells with {E}lectron
                      {M}icroscopy {A}llows for {I}nvestigation of {P}otential
                      {P}reparation {A}rtifacts},
      journal      = {Advanced materials interfaces},
      volume       = {7},
      number       = {6},
      issn         = {2196-7350},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2020-00643},
      pages        = {1901991 -},
      year         = {2020},
      abstract     = {The investigation of the cell–substrate interface is of
                      great importance for a broad spectrum of areas such as
                      biomedical engineering, brain‐chip interfacing, and
                      fundamental research. Due to its unique resolution and the
                      prevalence of instruments, electron microscopy (EM) is used
                      as one of the standard techniques for the analysis of the
                      cell–substrate interface. However, possible artifacts that
                      might be introduced by the required sample preparation have
                      been the subject of speculation for decades. Due to recent
                      advances in surface plasmon resonance microscopy (SPRM), the
                      technique now offers a label‐free alternative for the
                      interface characterization with nanometer resolution in
                      axial direction. In contrast to EM, SPRM studies do not
                      require fixation and can therefore be performed on living
                      cells. Here, a workflow that allows for the quantification
                      of the impact of chemical fixation on the cell–substrate
                      interface is presented. These measurements confirm that
                      chemical fixation preserves the average cell–substrate
                      distances in the majority of studied cells. Furthermore, it
                      is possible to correlate the SPRM measurements with EM
                      images of the cell–substrate interface of the exact same
                      cells, thus identifying regions of good agreement between
                      the two methods and revealing artifacts introduced during
                      further sample preparation.},
      cin          = {ICS-8 / HNF},
      ddc          = {600},
      cid          = {I:(DE-Juel1)ICS-8-20110106 / I:(DE-Juel1)HNF-20170116},
      pnm          = {552 - Engineering Cell Function (POF3-552)},
      pid          = {G:(DE-HGF)POF3-552},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000509620600001},
      doi          = {10.1002/admi.201901991},
      url          = {https://juser.fz-juelich.de/record/873330},
}