000875405 001__ 875405 000875405 005__ 20210130004928.0 000875405 0247_ $$2doi$$a10.1063/1.5143309 000875405 0247_ $$2ISSN$$a0003-6951 000875405 0247_ $$2ISSN$$a1077-3118 000875405 0247_ $$2ISSN$$a1520-8842 000875405 0247_ $$2Handle$$a2128/24893 000875405 0247_ $$2altmetric$$aaltmetric:80887654 000875405 0247_ $$2WOS$$aWOS:000522431800001 000875405 037__ $$aFZJ-2020-02014 000875405 082__ $$a530 000875405 1001_ $$0P:(DE-Juel1)130677$$aGunkel, F.$$b0$$eCorresponding author 000875405 245__ $$aOxygen vacancies: The (in)visible friend of oxide electronics 000875405 260__ $$aMelville, NY$$bAmerican Inst. of Physics$$c2020 000875405 3367_ $$2DRIVER$$aarticle 000875405 3367_ $$2DataCite$$aOutput Types/Journal article 000875405 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1589548924_11541 000875405 3367_ $$2BibTeX$$aARTICLE 000875405 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000875405 3367_ $$00$$2EndNote$$aJournal Article 000875405 520__ $$aOxygen vacancies play crucial roles in determining the physical properties of metal oxides, representing important building blocks in many scientific and technological fields due to their unique chemical, physical, and electronic properties. However, oxygen vacancies are often invisible because of their dilute concentrations. Therefore, characterizing and quantifying their presence is of utmost importance for understanding and realizing functional metal oxide devices. This, however, is oftentimes a non-trivial task. In this Perspective paper, we discuss the relevant regimes of concentrations and associated phenomena arising from oxygen vacancies. We then focus on experimental techniques available for observing oxygen vacancies at widely different levels of concentrations. Finally, we discuss current challenges and opportunities for utilizing oxygen vacancies in metal oxides. 000875405 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0 000875405 588__ $$aDataset connected to CrossRef 000875405 7001_ $$00000-0003-0048-7595$$aChristensen, D. V.$$b1 000875405 7001_ $$0P:(DE-HGF)0$$aChen, Y. Z.$$b2 000875405 7001_ $$00000-0002-5718-7924$$aPryds, N.$$b3 000875405 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.5143309$$gVol. 116, no. 12, p. 120505 -$$n12$$p120505 -$$tApplied physics letters$$v116$$x1077-3118$$y2020 000875405 8564_ $$uhttps://juser.fz-juelich.de/record/875405/files/1.5143309.pdf$$yOpenAccess 000875405 8564_ $$uhttps://juser.fz-juelich.de/record/875405/files/1.5143309.pdf?subformat=pdfa$$xpdfa$$yOpenAccess 000875405 909CO $$ooai:juser.fz-juelich.de:875405$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire 000875405 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130677$$aForschungszentrum Jülich$$b0$$kFZJ 000875405 9101_ $$0I:(DE-HGF)0$$6P:(DE-HGF)0$$aExternal Institute$$b2$$kExtern 000875405 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0 000875405 9141_ $$y2020 000875405 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS 000875405 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0 000875405 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search 000875405 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bAPPL PHYS LETT : 2017 000875405 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection 000875405 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index 000875405 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded 000875405 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5 000875405 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess 000875405 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC 000875405 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences 000875405 915__ $$0StatID:(DE-HGF)0430$$2StatID$$aNational-Konsortium 000875405 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline 000875405 915__ $$0StatID:(DE-HGF)0320$$2StatID$$aDBCoverage$$bPubMed Central 000875405 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz 000875405 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List 000875405 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0 000875405 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1 000875405 980__ $$ajournal 000875405 980__ $$aVDB 000875405 980__ $$aUNRESTRICTED 000875405 980__ $$aI:(DE-Juel1)PGI-7-20110106 000875405 980__ $$aI:(DE-82)080009_20140620 000875405 9801_ $$aFullTexts