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000878260 1001_ $$0P:(DE-Juel1)145413$$aDuchamp, M.$$b0$$eCorresponding author
000878260 245__ $$aSTEM electron beam-induced current measurements of organic-inorganic perovskite solar cells
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000878260 520__ $$aWe describe a new approach for preparing organic-inorganic perovskite solar cells for electron beam-induced current (EBIC) measurements in plan-view geometry. This method substantially reduces sample preparation artefacts, provides good electrical contact and keeps the preparation steps as close as possible to those for real devices. Our EBIC images were acquired simultaneously with annular dark-field scanning transmission electron microscopy images using a home-made highly sensitive EBIC amplifier. High-angle annular dark-field images and energy dispersive X-ray maps were recorded from the same area immediately afterwards. This allowed the EBIC contrast to be correlated with regions containing N and a deficiency of O. The EBIC contrast was also found to be similar to secondary electron contrast recorded with a scanning electron microscope. By identifying the generation and absorption electron processes, we determine that EBIC cannot be separated from the secondary electron and absorbed currents. This means that careful analysis needs to be performed before conclusions can be made on the origin of the current measured across p-n or p-i-n junctions.
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000878260 7001_ $$0P:(DE-HGF)0$$aLam, Y. M.$$b2
000878260 7001_ $$0P:(DE-HGF)0$$aDunin-Borkowski, R. E.$$b3
000878260 7001_ $$0P:(DE-Juel1)144965$$aBoothroyd, C. B.$$b4
000878260 773__ $$0PERI:(DE-600)1479043-9$$a10.1016/j.ultramic.2020.113047$$gVol. 217, p. 113047 -$$p113047 -$$tUltramicroscopy$$v217$$x0304-3991$$y2020
000878260 8564_ $$uhttps://juser.fz-juelich.de/record/878260/files/ULTRAM_2018_114_Revision%202_V0_paper.pdf$$yPublished on 2020-06-11. Available in OpenAccess from 2022-06-11.
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