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@ARTICLE{Duchamp:878260,
      author       = {Duchamp, M. and Hu, H. and Lam, Y. M. and Dunin-Borkowski,
                      R. E. and Boothroyd, C. B.},
      title        = {{STEM} electron beam-induced current measurements of
                      organic-inorganic perovskite solar cells},
      journal      = {Ultramicroscopy},
      volume       = {217},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2020-02729},
      pages        = {113047 -},
      year         = {2020},
      abstract     = {We describe a new approach for preparing organic-inorganic
                      perovskite solar cells for electron beam-induced current
                      (EBIC) measurements in plan-view geometry. This method
                      substantially reduces sample preparation artefacts, provides
                      good electrical contact and keeps the preparation steps as
                      close as possible to those for real devices. Our EBIC images
                      were acquired simultaneously with annular dark-field
                      scanning transmission electron microscopy images using a
                      home-made highly sensitive EBIC amplifier. High-angle
                      annular dark-field images and energy dispersive X-ray maps
                      were recorded from the same area immediately afterwards.
                      This allowed the EBIC contrast to be correlated with regions
                      containing N and a deficiency of O. The EBIC contrast was
                      also found to be similar to secondary electron contrast
                      recorded with a scanning electron microscope. By identifying
                      the generation and absorption electron processes, we
                      determine that EBIC cannot be separated from the secondary
                      electron and absorbed currents. This means that careful
                      analysis needs to be performed before conclusions can be
                      made on the origin of the current measured across p-n or
                      p-i-n junctions.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:32623204},
      UT           = {WOS:000588011200001},
      doi          = {10.1016/j.ultramic.2020.113047},
      url          = {https://juser.fz-juelich.de/record/878260},
}