TY  - JOUR
AU  - Jannis, Daen
AU  - Müller-Caspary, Knut
AU  - Béché, Armand
AU  - Oelsner, Andreas
AU  - Verbeeck, Johan
TI  - Spectroscopic coincidence experiments in transmission electron microscopy
JO  - Applied physics letters
VL  - 114
IS  - 14
SN  - 1077-3118
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2020-02741
SP  - 143101
PY  - 2019
AB  - We demonstrate the feasibility of coincidence measurements on a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX) spectroscopy events. We make use of a delay line detector with ps-range time resolution attached to a modified EELS spectrometer. We demonstrate that coincidence between both events, related to the excitation and deexcitation of atoms in a crystal, provides added information not present in the individual EELS or EDX spectra. In particular, the method provides EELS with a significantly suppressed or even removed background, overcoming the many difficulties with conventional parametric background fitting as it uses no assumptions on the shape of the background, requires no user input and does not suffer from counting noise originating from the background signal. This is highly attractive, especially when low concentrations of elements need to be detected in a matrix of other elements.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000464450200022
DO  - DOI:10.1063/1.5092945
UR  - https://juser.fz-juelich.de/record/878278
ER  -