Journal Article FZJ-2020-02741

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Spectroscopic coincidence experiments in transmission electron microscopy

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2019
American Inst. of Physics Melville, NY

Applied physics letters 114(14), 143101 () [10.1063/1.5092945]

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Abstract: We demonstrate the feasibility of coincidence measurements on a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX) spectroscopy events. We make use of a delay line detector with ps-range time resolution attached to a modified EELS spectrometer. We demonstrate that coincidence between both events, related to the excitation and deexcitation of atoms in a crystal, provides added information not present in the individual EELS or EDX spectra. In particular, the method provides EELS with a significantly suppressed or even removed background, overcoming the many difficulties with conventional parametric background fitting as it uses no assumptions on the shape of the background, requires no user input and does not suffer from counting noise originating from the background signal. This is highly attractive, especially when low concentrations of elements need to be detected in a matrix of other elements.

Classification:

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
  2. moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317) (VH-NG-1317)
  3. ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717) (823717)

Appears in the scientific report 2020
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 Record created 2020-08-05, last modified 2021-01-30


Published on 2019-04-08. Available in OpenAccess from 2020-04-08.:
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