%0 Journal Article
%A Zheng, Fengshan
%A Migunov, Vadim
%A Caron, Jan
%A Du, Hongchu
%A Pozzi, Giulio
%A Dunin-Borkowski, Rafal E
%T Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography
%J Microscopy and microanalysis
%V 25
%N S2
%@ 1435-8115
%C New York, NY
%I Cambridge University Press
%M FZJ-2020-02773
%P 326 - 327
%D 2019
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1017/S1431927619002368
%U https://juser.fz-juelich.de/record/878317