Journal Article

FZJ-2020-02773

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography

Zheng, F.FZJ* ; Migunov, V.FZJ* ; Caron, J.FZJ* ; Du, H.FZJ* ; Pozzi, G. ; Dunin-Borkowski, R. E.FZJ*

2019
Cambridge University Press New York, NY

This record in other databases:

Please use a persistent id in citations: doi:10.1017/S1431927619002368

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)
2. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
3. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
2. SIMDALEE2 - Sources, Interaction with Matter, Detection and Analysis ofLow Energy Electrons 2 (606988) (606988)

Appears in the scientific report 2020

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Database coverage:
; Allianz-Lizenz / DFG ; BIOSIS Previews ; Biological Abstracts ; Clarivate Analytics Master Journal List ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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