TY  - JOUR
AU  - Zheng, Fengshan
AU  - Migunov, Vadim
AU  - Caron, Jan
AU  - Du, Hongchu
AU  - Pozzi, Giulio
AU  - Dunin-Borkowski, Rafal E
TI  - Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography
JO  - Microscopy and microanalysis
VL  - 25
IS  - S2
SN  - 1435-8115
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2020-02773
SP  - 326 - 327
PY  - 2019
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1017/S1431927619002368
UR  - https://juser.fz-juelich.de/record/878317
ER  -