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@ARTICLE{Zheng:878317,
      author       = {Zheng, Fengshan and Migunov, Vadim and Caron, Jan and Du,
                      Hongchu and Pozzi, Giulio and Dunin-Borkowski, Rafal E},
      title        = {{T}hree-dimensional electric field mapping of an
                      electrically biased atom probe needle using off-axis
                      electron holography},
      journal      = {Microscopy and microanalysis},
      volume       = {25},
      number       = {S2},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2020-02773},
      pages        = {326 - 327},
      year         = {2019},
      cin          = {ER-C-1 / ER-C-2 / PGI-5},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)ER-C-2-20170209 /
                      I:(DE-Juel1)PGI-5-20110106},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)
                      / SIMDALEE2 - Sources, Interaction with Matter, Detection
                      and Analysis ofLow Energy Electrons 2 (606988)},
      pid          = {G:(DE-HGF)POF3-143 / G:(EU-Grant)606988},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927619002368},
      url          = {https://juser.fz-juelich.de/record/878317},
}