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| 001 | 878317 | ||
| 005 | 20240610121232.0 | ||
| 024 | 7 | _ | |a 10.1017/S1431927619002368 |2 doi |
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| 100 | 1 | _ | |a Zheng, Fengshan |0 P:(DE-Juel1)165965 |b 0 |u fzj |
| 245 | _ | _ | |a Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography |
| 260 | _ | _ | |a New York, NY |c 2019 |b Cambridge University Press |
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| 773 | _ | _ | |a 10.1017/S1431927619002368 |g Vol. 25, no. S2, p. 326 - 327 |0 PERI:(DE-600)1481716-0 |n S2 |p 326 - 327 |t Microscopy and microanalysis |v 25 |y 2019 |x 1435-8115 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/878317/files/div-class-title-three-dimensional-electric-field-mapping-of-an-electrically-biased-atom-probe-needle-using-off-axis-electron-holography-div.pdf |y Restricted |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/878317/files/div-class-title-three-dimensional-electric-field-mapping-of-an-electrically-biased-atom-probe-needle-using-off-axis-electron-holography-div.pdf?subformat=pdfa |x pdfa |y Restricted |
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