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@ARTICLE{Vicarelli:878650,
      author       = {Vicarelli, Leonardo and Migunov, Vadim and Malladi, Sairam
                      K. and Zandbergen, Henny W. and Dunin-Borkowski, Rafal E.},
      title        = {{S}ingle {E}lectron {P}recision in the {M}easurement of
                      {C}harge {D}istributions on {E}lectrically {B}iased
                      {G}raphene {N}anotips {U}sing {E}lectron {H}olography},
      journal      = {Nano letters},
      volume       = {19},
      number       = {6},
      issn         = {1530-6992},
      address      = {Washington, DC},
      publisher    = {ACS Publ.},
      reportid     = {FZJ-2020-02971},
      pages        = {4091 - 4096},
      year         = {2019},
      abstract     = {We use off-axis electron holography to measure the
                      electrostatic charge density distributions on graphene-based
                      nanogap devices that have thicknesses of between 1 and 10
                      monolayers and separations of between 8 and 58 nm with a
                      precision of better than a single unit charge. Our
                      experimental measurements, which are compared with finite
                      element simulations, show that wider graphene tips, which
                      have thicknesses of a single monolayer at their ends,
                      exhibit charge accumulation along their edges. The results
                      are relevant for both fundamental research on graphene
                      electrostatics and applications of graphene nanogaps to
                      single nucleotide detection in DNA sequencing, single
                      molecule electronics, plasmonic antennae, and cold field
                      emission sources.},
      cin          = {ER-C-1},
      ddc          = {660},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)
                      / DFG project 167917811 - SFB 917: Resistiv schaltende
                      Chalkogenide für zukünftige Elektronikanwendungen:
                      Struktur, Kinetik und Bauelementskalierung "Nanoswitches"
                      (167917811) / ESTEEM3 - Enabling Science and Technology
                      through European Electron Microscopy (823717)},
      pid          = {G:(DE-HGF)POF3-143 / G:(GEPRIS)167917811 /
                      G:(EU-Grant)823717},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:31117760},
      UT           = {WOS:000471834900094},
      doi          = {10.1021/acs.nanolett.9b01487},
      url          = {https://juser.fz-juelich.de/record/878650},
}