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@ARTICLE{Deuter:878701,
author = {Deuter, Valerie and Grochowicz, Maciej and Brose, Sascha
and Biller, Jan and Danylyuk, Serhiy and Taubner, Thomas and
Siemion, Agnieszka and Grützmacher, Detlev and Juschkin,
Larissa},
title = {{C}omputational proximity lithography with extreme
ultraviolet radiation},
journal = {Optics express},
volume = {28},
number = {18},
issn = {1094-4087},
address = {Washington, DC},
publisher = {Soc.},
reportid = {FZJ-2020-03019},
pages = {27000 -},
year = {2020},
abstract = {The potential of extreme ultraviolet (EUV) computational
proximity lithography for fabrication of arbitrary nanoscale
patterns is investigated. We propose to use a holographic
mask (attenuating phase shifting mask) consisting of
structures of two phase levels. This approach allows
printing of arbitrary, non-periodic structures without using
high-resolution imaging optics. The holographic mask is
designed for a wavelength of 13.5 nm with a conventional
high-resolution electron beam resist as the phase shifting
medium (pixel size 50 nm). The imaging performance is
evaluated by using EUV radiation with different degrees of
spatial coherence. Therefore exposures on identical masks
are carried out with both undulator radiation at a
synchrotron facility and plasma-based radiation at a
laboratory setup.},
cin = {PGI-10 / PGI-9 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-10-20170113 / I:(DE-Juel1)PGI-9-20110106 /
$I:(DE-82)080009_20140620$},
pnm = {523 - Controlling Configuration-Based Phenomena (POF3-523)},
pid = {G:(DE-HGF)POF3-523},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:32906962},
UT = {WOS:000565713200110},
doi = {10.1364/OE.398805},
url = {https://juser.fz-juelich.de/record/878701},
}