Home > Workflow collections > Public records > Electronic and Structural Properties of N-Type Microcrystalline Silicon Oxide (uc-SiOx:H) Films for Applications in Thin Film Silicon Solar Cells |
Contribution to a conference proceedings/Contribution to a book | FZJ-2020-03349 |
; ;
2015
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: http://hdl.handle.net/2128/9683 doi:10.1016/j.egypro.2015.12.297
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