%0 Book Section
%A Gomeniuk, Y.Y.
%A Gomeniuk, Y.V.
%A Nazarov, A.N.
%A Hurley, P.K.
%A cherkaoui, K.
%A Monaghan, S.
%A Hellström, P.E.
%A Gottlob, H.D.B.
%A Schubert, J.
%A Lopes, J.M.J.
%T Electrical properties of high-k LaLuO3 gate oxide for SOI MOSFETs
%V 276
%@ 1662-8985
%C Zug
%I Scitec Publ.
%M FZJ-2020-03393
%B Advanced materials research
%P 87 - 93
%D 2011
%Z Record converted from VDB: 12.11.2012
%F PUB:(DE-HGF)7
%9 Contribution to a book
%U <Go to ISI:>//WOS:000303285000010
%R 10.4028/www.scientific.net/AMR.276.87
%U https://juser.fz-juelich.de/record/884989