| Home > Publications database > Long Term Resistivity Behavior of SOFC Interconnect/Ni-Mesh Interfaces |
| Contribution to a book | FZJ-2020-03684 |
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2013
Electrochemical Society (ECS)
Pennington, NJ
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Please use a persistent id in citations: http://hdl.handle.net/2128/5699 doi:10.1149/05701.2279ecst
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