| Home > Publications database > Tuning the Performance of Pt/HfO2/Ti/Pt ReRAM Devices Obtained from Plasma-Enhanced Atomic Layer Deposition for HfO2 Thin Films |
| Contribution to a book | FZJ-2020-03720 |
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2016
Pennington, NJ
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Please use a persistent id in citations: doi:10.1149/07506.0177ecst
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