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@ARTICLE{Bttger:885491,
author = {Böttger, Ulrich and von Witzleben, Moritz and Havel,
Viktor and Fleck, Karsten and Rana, Vikas and Waser, R. and
Menzel, Stephan},
title = {{P}icosecond multilevel resistive switching in tantalum
oxide thin films},
journal = {Scientific reports},
volume = {10},
number = {1},
issn = {2045-2322},
address = {[London]},
publisher = {Macmillan Publishers Limited, part of Springer Nature},
reportid = {FZJ-2020-03872},
pages = {16391},
year = {2020},
abstract = {The increasing demand for high-density data storage leads
to an increasing interest in novel memory concepts with high
scalability and the opportunity of storing multiple bits in
one cell. A promising candidate is the redox-based resistive
switch repositing the information in form of different
resistance states. For reliable programming, the underlying
physical parameters need to be understood. We reveal that
the programmable resistance states are linked to internal
series resistances and the fundamental nonlinear switching
kinetics. The switching kinetics of Ta2O5-based cells was
investigated in a wide range over 15 orders of magnitude
from 105 s to 250 ps. The capacitive charging time of our
device limits the direct observation of the set time below
770 ps, however, we found indication for an intrinsic
switching speed of 10 ps at a stimulus of 3 V. On all time
scales, multi-bit data storage capabilities were
demonstrated. The elucidated link between fundamental
material properties and multi-bit data storage paves the way
for designing resistive switches for memory and neuromorphic
applications.},
cin = {PGI-7 / JARA-FIT / PGI-10},
ddc = {600},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
I:(DE-Juel1)PGI-10-20170113},
pnm = {524 - Controlling Collective States (POF3-524)},
pid = {G:(DE-HGF)POF3-524},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:33009437},
UT = {WOS:000577150800006},
doi = {10.1038/s41598-020-73254-2},
url = {https://juser.fz-juelich.de/record/885491},
}