Contribution to a conference proceedings

FZJ-2021-00314

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Statistical Modeling and Understanding of HRS Retention in 2.5 Mb HfO 2 based ReRAM

Wiefels, S. ; Bottger, U. ; Menzel, S.FZJ* ; Wouters, D. J. ; Waser, R. (Corresponding author)FZJ*

2020
IEEE

This record in other databases:  

Please use a persistent id in citations: doi:10.1109/IMW48823.2020.9108123

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA Institut Green IT (PGI-10)
3. JARA-FIT (JARA-FIT)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2020

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