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@INPROCEEDINGS{Wiefels:889690,
author = {Wiefels, S. and Bottger, U. and Menzel, Stephan and
Wouters, D. J. and Waser, R.},
title = {{S}tatistical {M}odeling and {U}nderstanding of {HRS}
{R}etention in 2.5 {M}b {H}f{O} 2 based {R}e{RAM}},
publisher = {IEEE},
reportid = {FZJ-2021-00314},
pages = {1},
year = {2020},
month = {May},
date = {2020-05-17},
organization = {2020 IEEE International Memory
Workshop (IMW), Dresden (Germany), 17
May 2020 - 20 May 2020},
cin = {PGI-7 / PGI-10 / JARA-FIT},
cid = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-10-20170113 /
$I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)8},
UT = {WOS:000590125800008},
doi = {10.1109/IMW48823.2020.9108123},
url = {https://juser.fz-juelich.de/record/889690},
}