%0 Conference Paper
%A Wiefels, S.
%A Bottger, U.
%A Menzel, Stephan
%A Wouters, D. J.
%A Waser, R.
%T Statistical Modeling and Understanding of HRS Retention in 2.5 Mb HfO 2 based ReRAM
%I IEEE
%M FZJ-2021-00314
%P 1
%D 2020
%B 2020 IEEE International Memory Workshop (IMW)
%C 17 May 2020 - 20 May 2020, Dresden (Germany)
Y2 17 May 2020 - 20 May 2020
M2 Dresden, Germany
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%U <Go to ISI:>//WOS:000590125800008
%R 10.1109/IMW48823.2020.9108123
%U https://juser.fz-juelich.de/record/889690