000891503 001__ 891503
000891503 005__ 20230111074313.0
000891503 0247_ $$2doi$$a10.1017/S1431927620024605
000891503 0247_ $$2ISSN$$a1431-9276
000891503 0247_ $$2ISSN$$a1435-8115
000891503 0247_ $$2Handle$$a2128/27557
000891503 0247_ $$2altmetric$$aaltmetric:94536221
000891503 0247_ $$2pmid$$a33190677
000891503 0247_ $$2WOS$$aWOS:000596581400008
000891503 037__ $$aFZJ-2021-01569
000891503 041__ $$aEnglish
000891503 082__ $$a500
000891503 1001_ $$00000-0003-2334-2866$$aMendis, Budhika G.$$b0$$eCorresponding author
000891503 245__ $$aInelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
000891503 260__ $$aNew York, NY$$bCambridge University Press$$c2020
000891503 3367_ $$2DRIVER$$aarticle
000891503 3367_ $$2DataCite$$aOutput Types/Journal article
000891503 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1617978091_8824
000891503 3367_ $$2BibTeX$$aARTICLE
000891503 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000891503 3367_ $$00$$2EndNote$$aJournal Article
000891503 520__ $$aElectron backscatter diffraction (EBSD) and electron channeling contrast imaging (ECCI) are used to extract crystallographic information from bulk samples, such as their crystal structure and orientation as well as the presence of any dislocation and grain boundary defects. These techniques rely on the backscattered electron signal, which has a large distribution in electron energy. Here, the influence of plasmon excitations on EBSD patterns and ECCI dislocation images is uncovered by multislice simulations including inelastic scattering. It is shown that the Kikuchi band contrast in an EBSD pattern for silicon is maximum at small energy loss (i.e., few plasmon scattering events following backscattering), consistent with previous energy-filtered EBSD measurements. On the other hand, plasmon excitation has very little effect on the ECCI image of a dislocation. These results are explained by examining the role of the characteristic plasmon scattering angle on the intrinsic contrast mechanisms in EBSD and ECCI.
000891503 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000891503 588__ $$aDataset connected to CrossRef
000891503 7001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b1$$ufzj
000891503 7001_ $$0P:(DE-HGF)0$$aFindlay, Scott D.$$b2
000891503 7001_ $$0P:(DE-Juel1)172835$$aAllen, Leslie J.$$b3
000891503 773__ $$0PERI:(DE-600)1481716-0$$a10.1017/S1431927620024605$$gVol. 26, no. 6, p. 1147 - 1157$$n6$$p1147 - 1157$$tMicroscopy and microanalysis$$v26$$x1435-8115$$y2020
000891503 8564_ $$uhttps://juser.fz-juelich.de/record/891503/files/inelastic-scattering-in-electron-backscatter-diffraction-and-electron-channeling-contrast-imaging.pdf
000891503 8564_ $$uhttps://juser.fz-juelich.de/record/891503/files/PREPRINT%20Mendis%20MM26%20%282020%29%201147-1157%20-%20Inelastic%20Scattering%20in%20Electron%20Backscatter%20Diffraction%20and%20Electron%20Channeling%20Contrast%20Imaging.pdf$$yPublished on 2020-11-16. Available in OpenAccess from 2021-05-16.
000891503 909CO $$ooai:juser.fz-juelich.de:891503$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000891503 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130525$$aForschungszentrum Jülich$$b1$$kFZJ
000891503 9130_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000891503 9131_ $$0G:(DE-HGF)POF4-535$$1G:(DE-HGF)POF4-530$$2G:(DE-HGF)POF4-500$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$9G:(DE-HGF)POF4-5353$$aDE-HGF$$bKey Technologies$$lMaterials Systems Engineering$$vMaterials Information Discovery$$x0
000891503 9141_ $$y2021
000891503 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)1050$$2StatID$$aDBCoverage$$bBIOSIS Previews$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)1190$$2StatID$$aDBCoverage$$bBiological Abstracts$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0530$$2StatID$$aEmbargoed OpenAccess
000891503 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bMICROSC MICROANAL : 2019$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)1030$$2StatID$$aDBCoverage$$bCurrent Contents - Life Sciences$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG$$d2021-02-05$$wger
000891503 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2021-02-05
000891503 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz$$d2021-02-05$$wger
000891503 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2021-02-05
000891503 920__ $$lyes
000891503 9201_ $$0I:(DE-Juel1)ER-C-2-20170209$$kER-C-2$$lMaterialwissenschaft u. Werkstofftechnik$$x0
000891503 980__ $$ajournal
000891503 980__ $$aVDB
000891503 980__ $$aUNRESTRICTED
000891503 980__ $$aI:(DE-Juel1)ER-C-2-20170209
000891503 9801_ $$aFullTexts