Book/Dissertation / PhD Thesis FZJ-2021-02526

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High-Resolution Photocurrent Mapping of Thin-Film Silicon Solar Cells Using Scanning Near-Field Optical Microscopy



2021
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag Jülich
ISBN: 978-3-95806-548-2

Jülich : Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag, Schriften des Forschungszentrums Jülich Reihe Energie & Umwelt / Energy & Environment 536, xiii, 148 () = Dissertation, RWTH Aachen University, 2021

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Abstract: A solar cell is used to directly convert the sunlight into electrical energy. The keyindicator for the performance of a solar cell, hence for its competitiveness comparedwith other forms of renewable energies is the conversion efficiency. The conversionefficiency of a solar cell strongly depends on its local optoelectronic properties, suchas local light coupling efficiency or local material inhomogeneity, on the microscopicor even nanoscopic length scales. Therefore, an accurate understanding and assessmentof the specific effects of these factors on the photogenerated current wouldprovide valuable information for the improvement of the solar cell performance. Thiswork presents local photocurrent measurements of various thin-film silicon solar cellswith subwavelength spatial resolution by using an aperture-type scanning near-fieldoptical microscope (a-SNOM) as the illumination source. The measurement methodallows for direct access to the local optoelectronic properties. With the support offinite-difference time-domain (FDTD) simulations, their individual contributions tothe photocurrent generation are analyzed....


Note: Dissertation, RWTH Aachen University, 2021

Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 899 - ohne Topic (POF4-899) (POF4-899)

Appears in the scientific report 2021
Database coverage:
Creative Commons Attribution CC BY 4.0 ; OpenAccess
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The record appears in these collections:
Institute Collections > IMD > IMD-3
Document types > Theses > Ph.D. Theses
Document types > Books > Books
Workflow collections > Public records
IEK > IEK-5
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 Record created 2021-06-02, last modified 2024-07-12