000893048 001__ 893048
000893048 005__ 20240712084508.0
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000893048 0247_ $$2URN$$aurn:nbn:de:0001-2021080410
000893048 020__ $$a978-3-95806-548-2
000893048 037__ $$aFZJ-2021-02526
000893048 1001_ $$0P:(DE-Juel1)164229$$aCao, Zhao$$b0$$eCorresponding author
000893048 245__ $$aHigh-Resolution Photocurrent Mapping of Thin-Film Silicon Solar Cells Using Scanning Near-Field Optical Microscopy$$f- 2021-08-04
000893048 260__ $$aJülich$$bForschungszentrum Jülich GmbH Zentralbibliothek, Verlag$$c2021
000893048 300__ $$axiii, 148
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000893048 4900_ $$aSchriften des Forschungszentrums Jülich Reihe Energie & Umwelt / Energy & Environment$$v536
000893048 502__ $$aDissertation, RWTH Aachen University, 2021$$bDissertation$$cRWTH Aachen University$$d2021
000893048 520__ $$aA solar cell is used to directly convert the sunlight into electrical energy. The keyindicator for the performance of a solar cell, hence for its competitiveness comparedwith other forms of renewable energies is the conversion efficiency. The conversionefficiency of a solar cell strongly depends on its local optoelectronic properties, suchas local light coupling efficiency or local material inhomogeneity, on the microscopicor even nanoscopic length scales. Therefore, an accurate understanding and assessmentof the specific effects of these factors on the photogenerated current wouldprovide valuable information for the improvement of the solar cell performance. Thiswork presents local photocurrent measurements of various thin-film silicon solar cellswith subwavelength spatial resolution by using an aperture-type scanning near-fieldoptical microscope (a-SNOM) as the illumination source. The measurement methodallows for direct access to the local optoelectronic properties. With the support offinite-difference time-domain (FDTD) simulations, their individual contributions tothe photocurrent generation are analyzed....
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000893048 9141_ $$y2021
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