Datensatz #898236

SiC_Scope

Scanner for Early-Stage Quality Control in Silicon Carbide Crystals

Grant period	2020-04-01 - 2022-12-31
Funding body	European Union
Call number	H2020-EIC-SMEInst-2018-2020-3
Grant number	953549
Identifier	G:(EU-Grant)953549

Note: Industrially grown crystals are key to our modern life; from electric car batteries to airplane windows. One of the fastest-growing crystal segments is silicon carbide (SiC), highly demanded in semiconductor applications for power supplies, electric cars, solar inverters, trains, and wind turbines. SiC is expected to be one of the top-10 advanced materials in the market by 2021; the SiC device market will top €1.4B by 2023, with 31% CAGR from 2017-2023. Growing crystals is an imperfect process. Particularly so for SiC, where unnoticed defects affect as many as 70% of all final wafers. Existing quality control techniques spot the defects after the crystal has been processed. Increased cost of the low yield sets today an obstacle to the wide application of SiC. Scientific Visual (SV) is a Swiss company, established in 2010 and led by Dr. Ivan Orlov, PhD in crystallography, and COO Fréderic Falise. Our innovation, SiC_Scope, is a scanner to detect and map defects in raw SiC prior to crystal processing. Based on refractive index matching, it is more accurate and faster than existing solutions, providing increased yield at a lower cost. Using SiC_Scope, a single grower can obtain a 6.5M€/year cost saving. Moreover, the scanner gathers real-time information on the defects, which allows crystal growers to tune their processes, driving down the number of defective crystals. In this project, we will adapt our existing technology currently applied to sapphires and other transparent crystals to detect the defects present in SiC which is a non-transparent crystal. Scientific Visual expects to attain absolute market leadership.

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Datensatz erzeugt am 2021-10-08, letzte Änderung am 2023-02-07

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