Journal Article

FZJ-2021-04593

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]”

Giesen, M.FZJ* ; Jugovac, M. ; Zamborlini, G. ; Feyer, V.FZJ* ; Gunkel, F.FZJ* ; Mueller, D. N. (Corresponding author)

2021
Elsevier Amsterdam [u.a.]

This record in other databases:  

Please use a persistent id in citations: doi:10.1016/j.tsf.2021.138694

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. 1212 - Materials and Interfaces (POF4-121) (POF4-121)

Appears in the scientific report 2021

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Database coverage:
; BIOSIS Previews ; Biological Abstracts ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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