TY  - JOUR
AU  - Pedretti, Giacomo
AU  - Mannocci, Piergiulio
AU  - Li, Can
AU  - Sun, Zhong
AU  - Strachan, John Paul
AU  - Ielmini, Daniele
TI  - Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark
JO  - IEEE transactions on electron devices
VL  - 68
IS  - 9
SN  - 0018-9383
CY  - New York, NY
PB  - IEEE
M1  - FZJ-2021-06185
SP  - 4379 - 4383
PY  - 2021
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000686761500035
DO  - DOI:10.1109/TED.2021.3095430
UR  - https://juser.fz-juelich.de/record/904615
ER  -