Home > Publications database > Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark |
Journal Article | FZJ-2021-06185 |
; ; ; ; ;
2021
IEEE
New York, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/31490 doi:10.1109/TED.2021.3095430
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