%0 Journal Article
%A Lanza, Mario
%A Waser, R.
%A Ielmini, Daniele
%A Yang, Jie
%A Goux, Ludovic
%A Suñe, Jordi
%A Kenyon, Anthony Joseph
%A Mehonic, Adnan
%A Spiga, Sabina
%A Rana, Vikas
%A Wiefels, Stefan
%A Menzel, Stephan
%A Valov, Ilia
%A Villena, Marco A.
%A Miranda, Enrique
%A Jing, Xu
%A Campabadal, Francesca
%A Gonzalez, Mireia B.
%A Aguirre, Fernando
%A Palumbo, Felix
%A Zhu, Kaichen
%A Roldan, Juan Bautista
%A Puglisi, Francesco Maria
%A Larcher, Luca
%A Hou, Tuo-Hung
%A Prodromakis, Themis
%A Yang, Yuchao
%A Huang, Peng
%A Wan, Tianqing
%A Chai, Yang
%A Pey, Kin Leong
%A Raghavan, Nagarajan
%A Dueñas, Salvador
%A Wang, Tao
%A Xia, Qiangfei
%A Pazos, Sebastian
%T Standards for the Characterization of Endurance in Resistive Switching Devices
%J ACS nano
%V 15
%N 11
%@ 1936-0851
%C Washington, DC
%I Soc.
%M FZJ-2022-00730
%P 17214 - 17231
%D 2021
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:34730935
%U <Go to ISI:>//WOS:000747115200012
%R 10.1021/acsnano.1c06980
%U https://juser.fz-juelich.de/record/905489