Journal Article

FZJ-2022-00730

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Standards for the Characterization of Endurance in Resistive Switching Devices

Lanza, M. (Corresponding author) ; Waser, R.FZJ* ; Ielmini, D. ; Yang, J.FZJ* ; Goux, L. ; Suñe, J. ; Kenyon, A. J. ; Mehonic, A. ; Spiga, S. ; Rana, V.FZJ* ; Wiefels, S.FZJ* ; Menzel, S.FZJ* ; Valov, I.FZJ* ; Villena, M. A. ; Miranda, E. ; Jing, X. ; Campabadal, F. ; Gonzalez, M. B. ; Aguirre, F. ; Palumbo, F. ; Zhu, K. ; Roldan, J. B. ; Puglisi, F. M. ; Larcher, L. ; Hou, T.-H. ; Prodromakis, T. ; Yang, Y. ; Huang, P. ; Wan, T. ; Chai, Y. ; Pey, K. L. ; Raghavan, N. ; Dueñas, S. ; Wang, T. ; Xia, Q. ; Pazos, S.

2021
Soc. Washington, DC

This record in other databases:      

Please use a persistent id in citations: http://hdl.handle.net/2128/30333  doi:10.1021/acsnano.1c06980

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA Institut Green IT (PGI-10)
3. JARA-FIT (JARA-FIT)
4. Plasmaphysik (IEK-4)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2021

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF >= 10 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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