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Conference Presentation (Invited) FZJ-2022-00746
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Reliability Modeling of Memristive Devices based on the Valence Change Mechanism



2021

Memrisys 2021, TsukubaTsukuba, Japan, 1 Nov 2021 - 4 Nov 20212021-11-012021-11-04

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
  2. Advanced Computing Architectures (aca_20190115) (aca_20190115)

Appears in the scientific report 2021
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The record appears in these collections:
Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database
 Record created 2022-01-18, last modified 2023-02-09
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