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| 001 | 908066 | ||
| 005 | 20230815122842.0 | ||
| 024 | 7 | _ | |a 10.1103/PhysRevMaterials.6.064002 |2 doi |
| 024 | 7 | _ | |a 2475-9953 |2 ISSN |
| 024 | 7 | _ | |a 2476-0455 |2 ISSN |
| 024 | 7 | _ | |a 2128/31280 |2 Handle |
| 024 | 7 | _ | |a WOS:000809873200002 |2 WOS |
| 037 | _ | _ | |a FZJ-2022-02353 |
| 082 | _ | _ | |a 530 |
| 100 | 1 | _ | |a Lin, You-Ron |0 P:(DE-Juel1)173990 |b 0 |
| 245 | _ | _ | |a Boron nitride on SiC(0001) |
| 260 | _ | _ | |a College Park, MD |c 2022 |b APS |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 520 | _ | _ | |a In the field of van der Waals heterostructures, the twist angle between stacked two-dimensional layers has been identified to be of utmost importance for the properties of the heterostructures. In this context, we previously reported the growth of a single layer of unconventionally oriented epitaxial graphene that forms in a surfactant atmosphere [F. C. Bocquet et al., Phys. Rev. Lett. 125, 106102 (2020)]. The resulting G-R0∘ layer is aligned with the SiC lattice, and hence represents an important milestone towards high-quality twisted bilayer graphene, a frequently investigated model system in this field. Here, we focus on the surface structures obtained in the same surfactant atmosphere, but at lower preparation temperatures at which a boron nitride template layer forms on SiC(0001). In a comprehensive study based on complementary experimental and theoretical techniques, we find—in contrast to the literature—that this template layer is a hexagonal BxNy layer, but not high-quality hBN. It is aligned with the SiC lattice and gradually replaced by low-quality graphene in the 0∘ orientation of the BxNy template layer upon annealing. |
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| 700 | 1 | _ | |a Franke, Markus |0 P:(DE-Juel1)161374 |b 1 |
| 700 | 1 | _ | |a Parhizkar, Shayan |0 0000-0001-7976-1344 |b 2 |
| 700 | 1 | _ | |a Raths, Miriam |0 P:(DE-Juel1)172607 |b 3 |
| 700 | 1 | _ | |a Wen-zhe Yu, Victor |0 P:(DE-HGF)0 |b 4 |
| 700 | 1 | _ | |a Lee, Tien-Lin |0 P:(DE-HGF)0 |b 5 |
| 700 | 1 | _ | |a Soubatch, Serguei |b 6 |
| 700 | 1 | _ | |a Blum, Volker |0 0000-0001-8660-7230 |b 7 |
| 700 | 1 | _ | |a Tautz, F. Stefan |0 P:(DE-Juel1)128791 |b 8 |
| 700 | 1 | _ | |a Kumpf, Christian |0 P:(DE-Juel1)128774 |b 9 |
| 700 | 1 | _ | |a Bocquet, François C. |0 P:(DE-Juel1)167128 |b 10 |e Corresponding author |
| 773 | _ | _ | |a 10.1103/PhysRevMaterials.6.064002 |g Vol. 6, no. 6, p. 064002 |0 PERI:(DE-600)2898355-5 |n 6 |p 064002 |t Physical review materials |v 6 |y 2022 |x 2475-9953 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/908066/files/PhysRevMaterials.6.064002.pdf |y OpenAccess |
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