Home > Publications database > Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates > print

001     908874
005     20230307154512.0
024 7 _ |a 10.3390/nano12111790
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100 1 _ |a Mulder, Liesbeth
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245 _ _ |a Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates
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520 _ _ |a Ultrathin films of the ternary topological insulator (Bi0.4Sb0.6)2Te3 are fabricated by molecular beam epitaxy. Although it is generally assumed that the ternary topological insulator tellurides grow by van der Waals epitaxy, our results show that the influence of the substrate is substantial and governs the formation of defects, mosaicity, and twin domains. For this comparative study, InP (111)A, Al2O3 (001), and SrTiO3 (111) substrates were selected. While the films deposited on lattice-matched InP (111)A show van der Waals epitaxial relations, our results point to a quasi-van der Waals epitaxy for the films grown on substrates with a larger lattice mismatch.
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700 1 _ |a Wielens, Daan H.
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700 1 _ |a Birkhölzer, Yorick A.
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700 1 _ |a Brinkman, Alexander
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700 1 _ |a Concepción Diaz, Omar
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773 _ _ |a 10.3390/nano12111790
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856 4 _ |u https://juser.fz-juelich.de/record/908874/files/nanomaterials-12-01790-v2.pdf
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