TY  - JOUR
AU  - Zheng, Fengshan
AU  - Beleggia, Marco
AU  - Migunov, Vadim
AU  - Pozzi, Giulio
AU  - Dunin-Borkowski, Rafal
TI  - Electron-beam-induced charging of an Al2O3 nanotip studied using off-axis electron holography
JO  - Ultramicroscopy
VL  - 241
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2022-02896
SP  - 113593
PY  - 2022
AB  - Electrostatic charging of specimens during electron, photon or ion irradiation is a complicated and poorly understood phenomenon, which can affect the acquisition and interpretation of experimental data and alter the functional properties of the constituent materials. It is usually linked to secondary electron emission, but also depends on the geometry and electrical properties of the specimen. Here, we use off-axis electron holography in the transmission electron microscope to study electron-beam-induced charging of an insulating AlO3 nanotip on a conducting support. The measurements are performed under parallel electron illumination conditions as a function of specimen temperature, electron dose, primary electron energy and surface cleanliness. We observe a lack of reproducibility of charge density measurements after cycling the specimen temperature. Surprisingly, we find both positively and negatively charged regions in closely adjacent parts of the specimen.
LB  - PUB:(DE-HGF)16
C6  - 35944328
UR  - <Go to ISI:>//WOS:000843004400001
DO  - DOI:10.1016/j.ultramic.2022.113593
UR  - https://juser.fz-juelich.de/record/908883
ER  -