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@ARTICLE{Zheng:908883,
      author       = {Zheng, Fengshan and Beleggia, Marco and Migunov, Vadim and
                      Pozzi, Giulio and Dunin-Borkowski, Rafal},
      title        = {{E}lectron-beam-induced charging of an {A}l2{O}3 nanotip
                      studied using off-axis electron holography},
      journal      = {Ultramicroscopy},
      volume       = {241},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2022-02896},
      pages        = {113593},
      year         = {2022},
      abstract     = {Electrostatic charging of specimens during electron, photon
                      or ion irradiation is a complicated and poorly understood
                      phenomenon, which can affect the acquisition and
                      interpretation of experimental data and alter the functional
                      properties of the constituent materials. It is usually
                      linked to secondary electron emission, but also depends on
                      the geometry and electrical properties of the specimen.
                      Here, we use off-axis electron holography in the
                      transmission electron microscope to study
                      electron-beam-induced charging of an insulating AlO3 nanotip
                      on a conducting support. The measurements are performed
                      under parallel electron illumination conditions as a
                      function of specimen temperature, electron dose, primary
                      electron energy and surface cleanliness. We observe a lack
                      of reproducibility of charge density measurements after
                      cycling the specimen temperature. Surprisingly, we find both
                      positively and negatively charged regions in closely
                      adjacent parts of the specimen.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / SIMDALEE2 - Sources,
                      Interaction with Matter, Detection and Analysis ofLow Energy
                      Electrons 2 (606988) / ESTEEM3 - Enabling Science and
                      Technology through European Electron Microscopy (823717) /
                      DFG project 167917811 - SFB 917: Resistiv schaltende
                      Chalkogenide für zukünftige Elektronikanwendungen:
                      Struktur, Kinetik und Bauelementskalierung "Nanoswitches"
                      (167917811) / Q-SORT - QUANTUM SORTER (766970)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(EU-Grant)606988 /
                      G:(EU-Grant)823717 / G:(GEPRIS)167917811 /
                      G:(EU-Grant)766970},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {35944328},
      UT           = {WOS:000843004400001},
      doi          = {10.1016/j.ultramic.2022.113593},
      url          = {https://juser.fz-juelich.de/record/908883},
}