TY  - JOUR
AU  - Lu, Yan
AU  - Zheng, Fengshan
AU  - Lan, Qianqian
AU  - Schnedler, Michael
AU  - Ebert, Philipp
AU  - Dunin-Borkowski, Rafal E.
TI  - Counting Point Defects at Nanoparticle Surfaces by Electron Holography
JO  - Nano letters
VL  - 22
IS  - 17
SN  - 1530-6984
CY  - Washington, DC
PB  - ACS Publ.
M1  - FZJ-2022-03245
SP  - 6936–6941
PY  - 2022
AB  - Metal oxide nanoparticles exhibit outstanding catalytic properties, believed to be related to the presence of oxygen vacancies at the particle’s surface. However, little quantitative information is known about concentrations of point defects inside and at surfaces of these nanoparticles, due to the challenges in achieving an atomically resolved experimental access. By employing off-axis electron holography, we demonstrate, using MgO nanoparticles as an example, a methodology that discriminates between mobile charge induced by electron beam irradiation and immobile charge associated with deep traps induced by point defects as well as distinguishes between bulk and surface point defects. Counting the immobile charge provides a quantification of the concentration of F2+ centers induced by oxygen vacancies at the MgO nanocube surfaces.
LB  - PUB:(DE-HGF)16
C6  - 36041122
UR  - <Go to ISI:>//WOS:000855232100001
DO  - DOI:10.1021/acs.nanolett.2c01510
UR  - https://juser.fz-juelich.de/record/909556
ER  -