Journal Article

FZJ-2022-03245

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Counting Point Defects at Nanoparticle Surfaces by Electron Holography

Lu, Y. (Corresponding author)FZJ* ; Zheng, F. (Corresponding author)FZJ* ; Lan, Q.FZJ* ; Schnedler, M. (Corresponding author)FZJ* ; Ebert, P.FZJ* ; Dunin-Borkowski, R. E.FZJ*

2022
ACS Publ. Washington, DC

This record in other databases:      

Please use a persistent id in citations: http://hdl.handle.net/2128/32012  doi:10.1021/acs.nanolett.2c01510

Abstract: Metal oxide nanoparticles exhibit outstanding catalytic properties, believed to be related to the presence of oxygen vacancies at the particle’s surface. However, little quantitative information is known about concentrations of point defects inside and at surfaces of these nanoparticles, due to the challenges in achieving an atomically resolved experimental access. By employing off-axis electron holography, we demonstrate, using MgO nanoparticles as an example, a methodology that discriminates between mobile charge induced by electron beam irradiation and immobile charge associated with deep traps induced by point defects as well as distinguishes between bulk and surface point defects. Counting the immobile charge provides a quantification of the concentration of F2+ centers induced by oxygen vacancies at the MgO nanocube surfaces.

---

Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
2. SIMDALEE2 - Sources, Interaction with Matter, Detection and Analysis ofLow Energy Electrons 2 (606988) (606988)
3. Q-SORT - QUANTUM SORTER (766970) (766970)

Appears in the scientific report 2022

---

Database coverage:
; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 10 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

---