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Contribution to a conference proceedings/Contribution to a book | FZJ-2022-03417 |
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2022
IEEE
ISBN: 78-1-6654-8062-8
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Please use a persistent id in citations: doi:10.1109/WOLTE55422.2022.9882781
Abstract: Integrated Circuits (ICs) operating at cryogenic temperatures are expected to allow the development of scalable quantum computing systems consisting of thousands of physical quantum bits (qubits). However, since these ICs require undistorted power supply lines for optimal performance, the development of Power Management Units (PMUs) capable of cryogenic operation is also needed for the quantum computing systems scalability. To develop such PMUs, it is necessary to understand the cryogenic electrical behavior of its components. Therefore, this brief present the measurement results obtained from an exploratory cryogenic DC characterization of some of the passive and active components belonging to a commercial 22nm FDSOI IC technology.
Keyword(s): Engineering, Industrial Materials and Processing (1st) ; Instrument and Method Development (2nd)
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