%0 Conference Paper
%A Ebert, Philipp
%T Quantifying polarization changes at nitride semiconductor interfaces by scanning tunneling microscopy and off-axis electron holography(American Vacuum Society Taiwan Chapter symposium on “Advances in Scanned Probe Microscopy”).
%M FZJ-2022-03594
%D 2021
%B Taiwan-AVS symposium
%C 28 Jan 2021 - 29 Jan 2021, virtuell (Taiwan)
Y2 28 Jan 2021 - 29 Jan 2021
M2 virtuell, Taiwan
%F PUB:(DE-HGF)31
%9 Talk (non-conference)
%U https://juser.fz-juelich.de/record/910066